IEC 62415:2010 ED1

Name: IEC 62415:2010 ED1
Brand: IEC
SKU: IEC 62415:2010 ED1
Price: 48.4 EUR
Availability: InStock
Rating: 5 (68 reviews)

Semiconductor devices - Constant current electromigration test

Current stage: 60.60 Standard published May 19, 2010

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

Status: Published

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Languages: English French

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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

PUBLISHED
IEC 62415:2010 ED1
60.60 Standard published
May 19, 2010