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IEC 62415:2010 ED1

Semiconductor devices - Constant current electromigration test IEC 62415:2010 ED1

Publication date:   May 19, 2010

General information

60.60   Standard published   May 19, 2010

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

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PUBLISHED
IEC 62415:2010 ED1
60.60 Standard published
May 19, 2010




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