IEC 62132-8 ED2

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method IEC 62132-8 ED2

Current stage: 40.20 DIS ballot initiated: 12 weeks Mar 7, 2025

Next stage: PRVC Next stage date : May 30, 2025

Originator: IEC

Type: International Standard

ICS: 31.200 Integrated circuits. Microelectronics

IN_DEVELOPMENT
IEC 62132-8 ED2
40.20 DIS ballot initiated: 12 weeks
Mar 7, 2025