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IEC 62132-8:2012 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method IEC 62132-8:2012 ED1

Publication date:   Jul 6, 2012

General information

99.60   Withdrawal effective   Feb 12, 2026

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Revised

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Scope

IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.

This publication is to be read in conjunction with IEC 62132-1:2006.

Life cycle

NOW

WITHDRAWN
IEC 62132-8:2012 ED1
99.60 Withdrawal effective
Feb 12, 2026

REVISED BY

PUBLISHED
IEC 62132-8:2026 ED2




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