IEC 62047-52 ED1

Semiconductor Devices - Micro-electromechanical Devices - Part 52: Biaxial tensile testing method for stretchable MEMS

Current stage: 30.20 CD study/ballot initiated Sep 13, 2024

Next stage: PCC Next stage date : Nov 8, 2024

Originator: IEC

Type: International Standard

ICS: 31.080.99 Other semiconductor devices

IN_DEVELOPMENT
IEC 62047-52 ED1
30.20 CD study/ballot initiated
Sep 13, 2024