0

IEC 62047-52 ED1

Semiconductor Devices - Micro-electromechanical Devices - Part 52: Biaxial tensile testing method for stretchable MEMS IEC 62047-52 ED1

General information

20.99 WD approved for registration as CD   Mar 15, 2024

CD    Jul 26, 2024

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-52 ED1
20.99 WD approved for registration as CD
Mar 15, 2024