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IEC 62047-51 ED1

Semiconductor Devices - Micro-electromechanical Devices - Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible micro-electromechanical devices IEC 62047-51 ED1

General information

30.20 CD study/ballot initiated   Nov 22, 2024

PCC    Feb 14, 2025

IEC

TC 47/SC 47F

International Standard

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-51 ED1
30.20 CD study/ballot initiated
Nov 22, 2024