60.60 Standard published Apr 29, 2025
IEC
International Standard
31.080.99 Other semiconductor devices
IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.
This document applies to MEMS capacitive microphones.
PUBLISHED
IEC 62047-50:2025 ED1
60.60
Standard published
Apr 29, 2025