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IEC 62047-50:2025 ED1

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones IEC 62047-50:2025 ED1

Publication date:   Apr 29, 2025

General information

60.60   Standard published   Apr 29, 2025

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.
This document applies to MEMS capacitive microphones.

Life cycle

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PUBLISHED
IEC 62047-50:2025 ED1
60.60 Standard published
Apr 29, 2025




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