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IEC 62047-49 ED1

Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers IEC 62047-49 ED1

General information

40.99 Full report circulated: DIS approved for registration as FDIS   Dec 13, 2024

DECFDIS    Jul 25, 2025

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

Life cycle

NOW

IN_DEVELOPMENT
IEC 62047-49 ED1
40.99 Full report circulated: DIS approved for registration as FDIS
Dec 13, 2024