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IEC 62047-40:2021 ED1

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold IEC 62047-40:2021 ED1

Publication date:   Sep 3, 2021

General information

60.60 Standard published   Sep 3, 2021

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

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Scope

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.

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PUBLISHED
IEC 62047-40:2021 ED1
60.60 Standard published
Sep 3, 2021