IEC 62047-38:2021 ED1

Semiconductor devices - Micro-electromechanical devices - Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection IEC 62047-38:2021 ED1

Publication date:   Jun 23, 2021

General information

60.60 Standard published   Jun 23, 2021

IEC

TC 47/SC 47F

International Standard

31.080.99   Other semiconductor devices

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IEC 62047-38:2021(E) specifies a test method for measuring the adhesion strength of metal powder paste in the electrical interconnection between micro-electromechanical systems (MEMS) and a circuit board. The typical examples of metal powder paste are anisotropic conductive paste, solder paste, and nanoscale metallic inks. This testing method is valid for metal powder diameters from 10 µm and 500 µm.
In this test method, a uniaxial compression load is applied to metal powder paste using a glass lens simulating an actual MEMS device; then, the adhesion strength is measured by retracting the lens. This test method is proper when the adhesion strength should be analyzed by considering the actual contact area between the MEMS device and metal powder particles.

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PUBLISHED
IEC 62047-38:2021 ED1
60.60 Standard published
Jun 23, 2021