IEC 61967-6:2002/COR1:2010 ED1

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Current stage: 60.60 Standard published Aug 30, 2010

Originator: IEC

Type: International Standard

ICS: 31.200 Integrated circuits. Microelectronics

PUBLISHED
IEC 61967-6:2002/COR1:2010 ED1
60.60 Standard published
Aug 30, 2010