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IEC 60749-41:2020 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

Publication date:   Jul 22, 2020

General information

60.60 Standard published   Jul 22, 2020

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

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PUBLISHED
IEC 60749-41:2020 ED1
60.60 Standard published
Jul 22, 2020