0

IEC 60749-41:2020 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices IEC 60749-41:2020 ED1

Publication date:   Jul 22, 2020

General information

60.60 Standard published   Jul 22, 2020

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

Published

Language in which you want to receive the document.

Scope

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

Life cycle

NOW

PUBLISHED
IEC 60749-41:2020 ED1
60.60 Standard published
Jul 22, 2020