IEC 60749-34:2004 ED1

Name: IEC 60749-34:2004 ED1
Brand: IEC
SKU: IEC 60749-34:2004 ED1
Price: 48.4 EUR
Availability: InStock
Rating: 4 (75 reviews)

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Publication date: Mar 10, 2004

General information

Current stage: 99.60 Withdrawal effective Oct 28, 2010

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Revised

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Languages: English French Spanish

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Scope

Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.

Life cycle

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WITHDRAWN
IEC PAS 62206:2000 ED1

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WITHDRAWN
IEC 60749-34:2004 ED1
99.60 Withdrawal effective
Oct 28, 2010

REVISED BY

PUBLISHED
IEC 60749-34:2010 ED2