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IEC PAS 62206:2000 ED1

Power and temperature cycling IEC PAS 62206:2000 ED1

Publication date:   Nov 28, 2000

General information

99.60 Withdrawal effective   Mar 10, 2004

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.

Life cycle

NOW

WITHDRAWN
IEC PAS 62206:2000 ED1
99.60 Withdrawal effective
Mar 10, 2004

REVISED BY

WITHDRAWN
IEC 60749-34:2004 ED1