IEC 60749-29:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test IEC 60749-29:2003 ED1

Publication date:   Nov 4, 2003

Scope

Covers the I-test and the overvoltage latch-up testing of integrated circuits.
The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.