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IEC PAS 62181:2000 ED1

IC latch-up test IEC PAS 62181:2000 ED1

Publication date:   Jul 21, 2000

General information

99.60   Withdrawal effective   Nov 4, 2003

IEC

TC 47

Publicly Available Specification

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Replaced

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Scope

Establishes a method for determining IC latch-up characteristics and to define latch-up failure criteria. Applicable to NMOS, CMOS, bipolar, and all variations and combinations of these technologies.

Life cycle

NOW

WITHDRAWN
IEC PAS 62181:2000 ED1
99.60 Withdrawal effective
Nov 4, 2003

REVISED BY

WITHDRAWN
IEC 60749-29:2003 ED1




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