IEC 60749-2:2002/COR1:2003 ED1
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure IEC 60749-2:2002/COR1:2003 ED1
General information
60.60
Standard published
Aug 12, 2003
IEC
TC 47
International Standard
31.080.01
Semiconductor devices in general
Scope
Modification of the validity date: now put at 2007.
Life cycle
NOW
PUBLISHED
IEC 60749-2:2002/COR1:2003 ED1
60.60
Standard published
Aug 12, 2003