Menu

0

IEC 60749:1984/AMD2:1993 ED1

Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.

Publication date:   Sep 21, 1993

General information

99.60 Withdrawal effective   Oct 28, 1996

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

  Revised

PDF - €96.80

  English   French  



Buy

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60749:1984 ED1

NOW

WITHDRAWN
IEC 60749:1984/AMD2:1993 ED1
99.60 Withdrawal effective
Oct 28, 1996

REVISED BY

WITHDRAWN
IEC 60749:1996 ED2