IEC 60749-17:2003 ED1

Name: IEC 60749-17:2003 ED1
Brand: IEC
SKU: IEC 60749-17:2003 ED1
Price: 24.2 EUR
Availability: InStock
Rating: 4 (95 reviews)

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Publication date: Feb 20, 2003

General information

Current stage: 99.60 Withdrawal effective Mar 28, 2019

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Revised

PDF - €24.20

Languages: English French Spanish

Buy

Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
IEC 60749-17:2003 ED1
99.60 Withdrawal effective
Mar 28, 2019

REVISED BY

PUBLISHED
IEC 60749-17:2019 ED2