IEC 60749-17:2003 ED1

Name: IEC 60749-17:2003 ED1
Brand: IEC
SKU: IEC 60749-17:2003 ED1
Price: 24.2 EUR
Availability: InStock
Rating: 4 (72 reviews)

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Publication date: Feb 20, 2003

General information

Current stage: 99.60 Withdrawal effective Mar 28, 2019

Next stage: WPUB

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

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Status: Revised

PDF - €24.20

Languages: English French Spanish

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Scope

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Life cycle

NOW

WITHDRAWN
IEC 60749-17:2003 ED1
99.60 Withdrawal effective
Mar 28, 2019

REVISED BY

PUBLISHED
IEC 60749-17:2019 ED2