IEC 60749-13:2018 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere IEC 60749-13:2018 ED2

Publication date:   Feb 15, 2018

General information

60.60 Standard published   Feb 15, 2018

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

Published

Language in which you want to receive the document.

Scope

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Life cycle

NOW

PUBLISHED
IEC 60749-13:2018 ED2
60.60 Standard published
Feb 15, 2018