IEC 60749-11:2002/COR2:2003 ED1

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Current stage: 60.60 Standard published Aug 13, 2003

Originator: IEC

Owner: TC 47

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

Modification of the validity date: now put at 2007.

PUBLISHED
IEC 60749-11:2002/COR2:2003 ED1
60.60 Standard published
Aug 13, 2003