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IEC 60747-14-12 ED1

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors IEC 60747-14-12 ED1

General information

50.20   Proof sent to secretariat or FDIS ballot initiated: 8 weeks   Aug 28, 2026

PRVD    Oct 9, 2026

IEC

TC 47/SC 47E

International Standard

31.080.01   Semiconductor devices in general

Scope

IEC 60747-14-12 ED1 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.

Life cycle

NOW

IN_DEVELOPMENT
IEC 60747-14-12 ED1
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Aug 28, 2026




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