IEC 60747-11:1985 ED1

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

Publication date: Jan 1, 1985

95.99 Withdrawal of Standard Jul 31, 2015

General information

Current stage: 95.99 Withdrawal of Standard Jul 31, 2015

Originator: IEC

Owner: TC 47/SC 47E

Type: International Standard

ICS: 31.080.01 Semiconductor devices in general

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Status: Withdrawn

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Languages: English French

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Scope

Applies to discrete semiconductor devices, excluding optoelectronic
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.

Life cycle

NOW

WITHDRAWN
IEC 60747-11:1985 ED1
95.99 Withdrawal of Standard
Jul 31, 2015

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60747-11:1985/AMD1:1991 ED1

WITHDRAWN
IEC 60747-11:1985/AMD2:1996 ED1

REVISED BY

ABANDON
IEC 60747-11 ED2