IEC 60747-11:1985 ED1

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices IEC 60747-11:1985 ED1

Publication date:   Jan 1, 1985

Scope

Applies to discrete semiconductor devices, excluding optoelectronic
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.