Menu

0

IEC 60747-1:1983 ED1

Semiconductor devices - Discrete devices - Part 1: General

Publication date:   Jan 1, 1983

General information

99.60 Withdrawal effective   Feb 21, 2006

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

  Revised

PDF - €363.00

  English   French  



Buy

Scope

Provides general information on scope and presentation of IEC 60747
and 60748.
Provides information on the general principles or requirements
applicable to IEC 60747-2, 60747-3, etc., including terminology and
letter symbols, essential ratings and characteristics, methods of
measurement, acceptance and reliability for the various categories
or sub-categories of discrete devices.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60147-1A:1963 ED1

WITHDRAWN
IEC 60147-2D:1972 ED1

WITHDRAWN
IEC 60147-1G:1975 ED2

WITHDRAWN
IEC 60147-2J:1978 ED1

WITHDRAWN
IEC 60147-0A:1969 ED1

WITHDRAWN
IEC 60147-2A:1969 ED1

WITHDRAWN
IEC 60147-2H:1976 ED1

NOW

WITHDRAWN
IEC 60747-1:1983 ED1
99.60 Withdrawal effective
Feb 21, 2006

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60747-1:1983/AMD1:1991 ED1

WITHDRAWN
IEC 60747-1:1983/AMD2:1993 ED1

WITHDRAWN
IEC 60747-1:1983/AMD3:1996 ED1

REVISED BY

PUBLISHED
IEC 60747-1:2006 ED2