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IEC 60747-1:1983 ED1

Semiconductor devices - Discrete devices - Part 1: General IEC 60747-1:1983 ED1

Publication date:   Jan 1, 1983

General information

99.60 Withdrawal effective   Feb 21, 2006

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

Revised

Language in which you want to receive the document.

Scope

Provides general information on scope and presentation of IEC 60747
and 60748.
Provides information on the general principles or requirements
applicable to IEC 60747-2, 60747-3, etc., including terminology and
letter symbols, essential ratings and characteristics, methods of
measurement, acceptance and reliability for the various categories
or sub-categories of discrete devices.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60147-1A:1963 ED1

WITHDRAWN
IEC 60147-2D:1972 ED1

WITHDRAWN
IEC 60147-1G:1975 ED2

WITHDRAWN
IEC 60147-2J:1978 ED1

WITHDRAWN
IEC 60147-0A:1969 ED1

WITHDRAWN
IEC 60147-2A:1969 ED1

WITHDRAWN
IEC 60147-2H:1976 ED1

NOW

WITHDRAWN
IEC 60747-1:1983 ED1
99.60 Withdrawal effective
Feb 21, 2006

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60747-1:1983/AMD1:1991 ED1

WITHDRAWN
IEC 60747-1:1983/AMD2:1993 ED1

WITHDRAWN
IEC 60747-1:1983/AMD3:1996 ED1

REVISED BY

PUBLISHED
IEC 60747-1:2006 ED2