60.60 Standard published Aug 30, 2010
IEC
International Standard
31.080.01 Semiconductor devices in general
Published
IEC 60191-6-20:2010 specifies methods to measure package dimensions of small outline J-lead-packages (SOJ), package outline form E in accordance with IEC 60191-4.
PUBLISHED
IEC 60191-6-20:2010 ED1
60.60
Standard published
Aug 30, 2010