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IEC 60191-6-20:2010 ED1

Mechanical standardization of semiconductor devices - Part 6-20: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of small outline J-lead packages (SOJ) IEC 60191-6-20:2010 ED1

Publication date:   Aug 30, 2010

General information

60.60   Standard published   Aug 30, 2010

IEC

TC 47/SC 47D

International Standard

31.080.01   Semiconductor devices in general

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Scope

IEC 60191-6-20:2010 specifies methods to measure package dimensions of small outline J-lead-packages (SOJ), package outline form E in accordance with IEC 60191-4.

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PUBLISHED
IEC 60191-6-20:2010 ED1
60.60 Standard published
Aug 30, 2010




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