60.60 Standard published May 12, 2023
CENELEC
European Norm
31.080.01 Semiconductor devices in general
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
PUBLISHED
EN IEC 63287-2:2023
60.60
Standard published
May 12, 2023