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EN 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors EN 62416:2010

Publication date:   Sep 16, 2010

General information

60.60 Standard published   Jun 4, 2010

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080   Semiconductor devices

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Scope

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

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PUBLISHED
EN 62416:2010
60.60 Standard published
Jun 4, 2010