EN 62415:2010
Semiconductor devices - Constant current electromigration test EN 62415:2010
Publication date:
Sep 16, 2010
General information
60.60
Standard published
Jun 4, 2010
CENELEC
CLC/SR 47
Semiconductor devices
European Norm
31.080
Semiconductor devices
Scope
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
Life cycle
NOW
PUBLISHED
EN 62415:2010
60.60
Standard published
Jun 4, 2010