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EN 62415:2010

Semiconductor devices - Constant current electromigration test EN 62415:2010

Publication date:   Sep 16, 2010

General information

60.60   Standard published   Jun 4, 2010

CENELEC

CLC/TC 47X

European Norm

31.080   Semiconductor devices

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Scope

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.

Life cycle

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PUBLISHED
EN 62415:2010
60.60 Standard published
Jun 4, 2010




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