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EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Publication date:   Dec 27, 2006

General information

90.93   Standard confirmed   Feb 16, 2026

CENELEC

CLC/TC 47X

European Norm

31.080   Semiconductor devices

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Life cycle

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PUBLISHED
EN 62373:2006
90.93 Standard confirmed
Feb 16, 2026