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EN 62373:2006

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) EN 62373:2006

Publication date:   Dec 27, 2006

General information

60.60 Standard published   Aug 10, 2006

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080   Semiconductor devices

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Scope

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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PUBLISHED
EN 62373:2006
60.60 Standard published
Aug 10, 2006