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EN 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Publication date:   Nov 20, 2003

General information

60.60 Standard published   Oct 8, 2002

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics

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Scope

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz.

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PUBLISHED
EN 61967-6:2002
60.60 Standard published
Oct 8, 2002

CORRIGENDA / AMENDMENTS

PUBLISHED
EN 61967-6:2002/A1:2008