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EN 61967-6:2002/A1:2008

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method EN 61967-6:2002/A1:2008

Publication date:   Jul 25, 2008

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60.60   Standard published   May 14, 2008

CENELEC

CLC/TC 47X

European Norm

31.200   Integrated circuits. Microelectronics

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60.60 Standard published
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