EN 61000-4-20:2003

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Publication date:   Aug 10, 2006

General information

99.60 Withdrawal effective   Oct 1, 2013

CENELEC

CLC/TC 210 Electromagnetic Compatibility (EMC)

European Norm

33.100.10   Emission | 33.100.20   Immunity

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Scope

Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe · TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); · TEM waveguide validation methods for EMC measurements; · the EUT (i.e. EUT cabinet and cabling) definition; · test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and · test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

Related legislation

Legislation related to this standard

2004/108/EC

Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC

Life cycle

NOW

WITHDRAWN
EN 61000-4-20:2003
99.60 Withdrawal effective
Oct 1, 2013

CORRIGENDA / AMENDMENTS

WITHDRAWN
EN 61000-4-20:2003/A1:2007

REVISED BY

PUBLISHED
EN 61000-4-20:2010