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99.60 Withdrawal effective Oct 1, 2013
CENELEC
CLC/TC 210 Electromagnetic Compatibility (EMC)
European Norm
Withdrawn
Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe · TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); · TEM waveguide validation methods for EMC measurements; · the EUT (i.e. EUT cabinet and cabling) definition; · test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and · test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.
Legislation related to this standard
Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
WITHDRAWN
EN 61000-4-20:2003
99.60
Withdrawal effective
Oct 1, 2013
WITHDRAWN
EN 61000-4-20:2003/A1:2007
PUBLISHED
EN 61000-4-20:2010