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EN 60749-42:2014

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage EN 60749-42:2014

Publication date:   Feb 17, 2015

General information

60.60 Standard published   Oct 3, 2014

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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Scope

IEC 60749-42:2014 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.

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PUBLISHED
EN 60749-42:2014
60.60 Standard published
Oct 3, 2014