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EN 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

Publication date:   Dec 27, 2006

General information

99.60   Withdrawal effective   Jan 3, 2025

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

Life cycle

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WITHDRAWN
EN 60749-39:2006
99.60 Withdrawal effective
Jan 3, 2025

REVISED BY

PUBLISHED
EN IEC 60749-39:2022