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EN 60749-39:2006

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components EN 60749-39:2006

Publication date:   Dec 27, 2006

General information

60.60 Standard published   Aug 25, 2006

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Detailed the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components. These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.

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PUBLISHED
EN 60749-39:2006
60.60 Standard published
Aug 25, 2006

REVISED BY

PUBLISHED
EN IEC 60749-39:2022