EN 60749-35:2006

Name: EN 60749-35:2006
Brand: CENELEC
SKU: EN 60749-35:2006
Price: 46.15 EUR
Availability: InStock
Rating: 5 (77 reviews)

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components

Publication date: Dec 27, 2006

General information

Current stage: 60.60 Standard published Sep 20, 2006

Originator: CENELEC

Owner: CLC/TC 47X

Type: European Norm

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Published

PDF - €46.15

Languages: English

Buy

Scope

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

Life cycle

NOW

PUBLISHED
EN 60749-35:2006
60.60 Standard published
Sep 20, 2006