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EN 60749-35:2006

Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components EN 60749-35:2006

Publication date:   Dec 27, 2006

General information

60.60   Standard published   Sep 20, 2006

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Defines the procedures for performing acoustic microscopy on plastic encapsulated electronic components. Provides a guide to the use of acoustic microscopy for detecting anomalies (delamination, cracks, mould-compound voids, etc.) reproducibly and non-destructively in plastic packages.

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PUBLISHED
EN 60749-35:2006
60.60 Standard published
Sep 20, 2006




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