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EN 60749-32:2003

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) EN 60749-32:2003

Publication date:   Dec 22, 2003

General information

60.60 Standard published   Jun 20, 2003

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.

Life cycle

NOW

PUBLISHED
EN 60749-32:2003
60.60 Standard published
Jun 20, 2003

CORRIGENDA / AMENDMENTS

PUBLISHED
EN 60749-32:2003/A1:2010

PUBLISHED
EN 60749-32:2003/corrigendum Jul. 2003