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EN 60749-23:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Publication date:   Aug 10, 2006

General information

60.60 Standard published   Apr 16, 2004

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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Scope

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Life cycle

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PUBLISHED
EN 60749-23:2004
60.60 Standard published
Apr 16, 2004

CORRIGENDA / AMENDMENTS

PUBLISHED
EN 60749-23:2004/A1:2011

REVISED BY

IN_DEVELOPMENT
prEN IEC 60749-23:2024