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EN 60749-19:2003/A1:2010

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength EN 60749-19:2003/A1:2010

Publication date:   Jan 21, 2011

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60.60   Standard published   Sep 3, 2010

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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