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EN 60749-15:2010/AC:2011

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices EN 60749-15:2010/AC:2011

General information

99.60 Withdrawal effective   Aug 18, 2023

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749-15:2010

NOW

WITHDRAWN
EN 60749-15:2010/AC:2011
99.60 Withdrawal effective
Aug 18, 2023

REVISED BY

PUBLISHED
EN IEC 60749-15:2020