IEC 62007-2:1997 ED1
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods IEC 62007-2:1997 ED1
Publication date:
Sep 17, 1997
General information
99.60
Withdrawal effective
Jan 26, 2009
IEC
TC 86/SC 86C
International Standard
31.080.01
Semiconductor devices in general
| 31.260
Optoelectronics. Laser equipment
| 33.180.01
Fibre optic systems in general
Scope
Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems.
Life cycle
NOW
WITHDRAWN
IEC 62007-2:1997 ED1
99.60
Withdrawal effective
Jan 26, 2009
