IEC 62007-2:2009 ED2

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods IEC 62007-2:2009 ED2

Publication date:   Jan 26, 2009

General information

99.60   Withdrawal effective   Jul 11, 2025

IEC

TC 86/SC 86C

International Standard

31.080.01   Semiconductor devices in general | 31.260   Optoelectronics. Laser equipment | 33.180.01   Fibre optic systems in general

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Revised

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Scope

IEC 62007-2:2009 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. This edition includes the following significant technical changes with respect to the previous edition:
- descriptions related to analogue characteristics have been removed;
- some definitions and terms have been revised for harmonisation with other standards originating from SC 86C.

Life cycle

NOW

WITHDRAWN
IEC 62007-2:2009 ED2
99.60 Withdrawal effective
Jul 11, 2025

REVISED BY

PUBLISHED
IEC 62007-2:2025 ED3




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